Erfahren Sie mehr. The M1 beamline is equipped with a high-resolution scanning electron microscope HRSEM , which enables direct imaging of surface modification induced by the ion beam.
The sample can be rotated in-situ, switching from the ion beam into the electron beam of the microscope. This setup allows for in-situ investigation of morphological changes in nanostructures during swift heavy ion irradiation.
In addition, the beamline is equipped with an energy-dispersive X-ray EDX spectrometer for compositional analysis, and a set of micromanipulators that enable both electric and mechanical characterization of samples. This technique is powerful for analyzing desorbed and sputtered species from a sample surface under swift heavy ion irradiation. The M2 beamline is equipped with an on-line X-ray diffractometer, which allows ion irradiations and X-ray diffraction analysis at any angle of incidence.
This setup is ideal for investigating ion-induced modifications of the crystallographic structure of a wide range of materials. The M3 beamline features a multi-purpose chamber with several key components: a closed-cycle He-cryostat, a residual gas analyser, and a gas inlet system.
This chamber enables the investigation of outgassing from materials under irradiation, with tightly controlled temperature, gas atmosphere and irradiation conditions. Various spectroscopic methods are available to analyze material modifications during irradiation, including degradation of insulators and chemical evolution of molecular ices and complex molecules, which are particularly relevant to astrochemistry.
